Michael L. Bushnell -- Rutgers University

Vishwani D. Agrawal -- Lucent Technologies Bell Laboratories

BUILT-IN AND EXTERNAL TEST OF KNOWN GOOD DIE FOR MIXED SIGNAL MODULES

DARPA Contract F33615-96-01-5610

6/26/98


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Table of Contents

DARPA Program QUAD CHART

Path Delay Testing and System Configuration

Testability Insertion and Advantages

Absolute Chip Area Overhead

Author: CAIP Center

Email: bushnell@caip.rutgers.edu

Home Page: http://www-caip.rutgers.edu/~bushnell/rutgers.html