Sequential Circuit Equivalent State Test Generation (SEST) [41, 47, 48, 49, 44, 45, 43]
Distributed Sequential Circuit ATPG (Distributed Gentest) [2, 110, 116, 113, 111, 114, 109, 108]
Markov Process Sequential Circuit ATPG [85]
Sequential Circuit Delay-Fault ATPG [22, 25, 84, 26, 77, 24, 23, 21]
Future Directions in Testing [11]