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Next: Design for Testability Up: Testing Previous: Sequential ATPG

Logic and Fault Simulation

Combinational Circuit Delay-Fault Simulation [60, 55, 58, 62, 63, 61, 59, 57, 56, 54, 1]
Sequential Circuit Path Delay-Fault Simulation [24, 90]
Statistical and Approximate Delay Fault Coverage Estimation [71, 73, 70, 69, 87, 72, 86, 68]



Michael L. Bushnell
Mon Jun 22 16:04:26 EDT 1998