VLSI GROUP PUBLICATIONS

• Physical CAD
• CAD Frameworks
• Testing
  • Combinational Automatic Test-Pattern Generation (ATPG)
  • Sequential ATPG
  • Logic and Fault Simulation
  • Design for Testability
  • Built-In Self-Testing
  • Analog Testing
• Mathematics
• Mechanical Testing
• Programming Languages
• References
• About this document ...